可訂購部件
| 型號(hào) | 可訂購的器件編號(hào) | 訂購代碼(12NC) | 封裝 | 從經(jīng)銷商處購買 |
|---|---|---|---|---|
| 74VHC541D-Q100 | 74VHC541D-Q100J | 935300871118 | SOT163-1 | 訂單產(chǎn)品 |
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Click here for more information74VHC541D-Q100
Octal buffer/line driver; 3-state
The 74VHC541-Q100; 74VHCT541-Q100 are high-speed Si-gate CMOS devices.
The 74VHC541-Q100; 74VHCT541-Q100 are octal non-inverting buffer/line drivers with 3-state bus compatible outputs.
The 3-state outputs are controlled by the output enable inputs OE0 and OE1.
A HIGH on OEn causes the outputs to assume a high-impedance OFF-state.
This product has been qualified to the Automotive Electronics Council (AEC) standard Q100 (Grade 1) and is suitable for use in automotive applications.
Features and benefits
Automotive product qualification in accordance with AEC-Q100 (Grade 1)
Specified from -40 °C to +85 °C and from -40 °C to +125 °C
Balanced propagation delays
All inputs have a Schmitt-trigger action
Inputs accepts voltages higher than VCC
The 74VHC541-Q100 operates with CMOS input level
The 74VHCT541-Q100 operates with TTL input level
ESD protection:
HBM: ANSI/ESDA/JEDEC JS-001 class 2 exceeds 2000 V
CDM: ANSI/ESDA/JEDEC JS-002 class C3 exceeds 1000 V
Multiple package options
DHVQFN package with Side-Wettable Flanks enabling Automated Optical Inspection (AOI) of solder joints
參數(shù)類型
| 型號(hào) | VCC (V) | Logic switching levels | Output drive capability (mA) | fmax (MHz) | Nr of bits | Power dissipation considerations | Tamb (°C) | Rth(j-a) (K/W) | Ψth(j-top) (K/W) | Rth(j-c) (K/W) | Package name |
|---|---|---|---|---|---|---|---|---|---|---|---|
| 74VHC541D-Q100 | 2.0?-?5.5 | CMOS | ± 8 | 60 | 8 | low | -40~125 | 85 | 27.4 | 61 | SO20 |
PCB Symbol, Footprint and 3D Model
| Model Name | 描述 |
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封裝
| 型號(hào) | 可訂購的器件編號(hào)，（訂購碼(12NC)） | 狀態(tài) | 標(biāo)示 | 封裝 | 外形圖 | 回流焊/波峰焊 | 包裝 |
|---|---|---|---|---|---|---|---|
| 74VHC541D-Q100 | 74VHC541D-Q100J (935300871118) |
Active | 74VHC541D |
SO20 (SOT163-1) |
SOT163-1 |
WAVE_BG-BD-1
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SOT163-1_118 |
環(huán)境信息
| 型號(hào) | 可訂購的器件編號(hào) | 化學(xué)成分 | RoHS | RHF指示符 |
|---|---|---|---|---|
| 74VHC541D-Q100 | 74VHC541D-Q100J | 74VHC541D-Q100 |
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文檔 (9)
| 文件名稱 | 標(biāo)題 | 類型 | 日期 |
|---|---|---|---|
| 74VHC_VHCT541_Q100 | Octal buffer/line driver; 3-state | Data sheet | 2024-06-06 |
| AN90063 | Questions about package outline drawings | Application note | 2025-03-12 |
| SOT163-1 | 3D model for products with SOT163-1 package | Design support | 2020-01-22 |
| 74vhc541 | 74vhc541 IBIS model | IBIS model | 2013-04-08 |
| Nexperia_package_poster | Nexperia package poster | Leaflet | 2020-05-15 |
| SOT163-1 | plastic, small outline package; 20 leads; 1.27 mm pitch; 12.8 mm x 7.5 mm x 2.65 mm body | Package information | 2024-11-15 |
| SOT163-1_118 | SO20; Reel pack for SMD, 13"; Q1/T1 product orientation | Packing information | 2022-08-01 |
| 74VHC541D-Q100_Nexperia_Product_Reliability | 74VHC541D-Q100 Nexperia Product Reliability | Quality document | 2025-03-20 |
| WAVE_BG-BD-1 | Wave soldering profile | Wave soldering | 2021-09-08 |
Longevity
The Nexperia Longevity Program is aimed to provide our customers information from time to time about the expected time that our products can be ordered. The NLP is reviewed and updated regularly by our Executive Management Team. View our longevity program here.
PCB Symbol, Footprint and 3D Model
| Model Name | 描述 |
|---|---|
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訂購、定價(jià)與供貨
| 型號(hào) | Orderable part number | Ordering code (12NC) | 狀態(tài) | 包裝 | Packing Quantity | 在線購買 |
|---|---|---|---|---|---|---|
| 74VHC541D-Q100 | 74VHC541D-Q100J | 935300871118 | Active | SOT163-1_118 | 2,000 |
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樣品
作為 Nexperia 的客戶，您可以通過我們的銷售機(jī)構(gòu)訂購樣品。
如果您沒有 Nexperia 的直接賬戶，我們的全球和地區(qū)分銷商網(wǎng)絡(luò)可為您提供 Nexperia 樣品支持。查看官方經(jīng)銷商列表。
How does it work?
The interactive datasheets are based on the Nexperia MOSFET precision electrothermal models. With our interactive datasheets you can simply specify your own conditions interactively. Start by changing the values of the conditions. You can do this by using the sliders in the condition fields. By dragging the sliders you will see how the MOSFET will perform at the new conditions set.